Showing results: 1906 - 1920 of 4500 items found.
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VS6825 -
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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PI-3105 -
Pulse Instruments
This highly flexible system is designed to test a wide variety of imaging devices, from low-noise astronomy and medical devices, to military and machine-vision devices with GB/sec data rates.
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Labodam
Labodam aniline test equipment are designed with stepless speed regulation motors to have a smoother operation and automatic alarm system with sound and light to detect end point.
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CPC 100 -
OMICRON electronics
The patented CPC 100 primary injection test system replaces several individual testing devices. This reduces the costs for training and transport, and cuts down testing time.
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Inframet
Meters offered by Inframet are basically meters designed to support calibration of test systems manufactured by Inframet. The meters can be divided into two groups:*Temperature meters*Luminance meters
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P5573A -
Keysight Technologies
Keysight P5573A PCIe 6.0 Protocol Exerciser gives the flexibility in providing realistic traffic to devices under test and also able to emulate as a complex host system
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MS 1300 -
Meltronics Systemtech
BAPCON SIMULATOR is used to test and validate Boiler Auxiliaries Plant Control Unit (Sigma BAPCON). It has CAN interface for simulating inputs and it is a microprocessor based system.
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HIACC Engineering & Services Pvt. Ltd.
The pneumatic vertical shock and bump test system features an advanced design with a high degree of performance and automation. The testes is easy to use and have low maintenance requirements.
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HMS-3000 -
ECOPIA
Hall Effect Measurement System is very useful for measuring Carrier Concentration, Mobility, Resistivity and Hall Coefficient that should be pre-checked in order to grasp the electrical specifications of semiconductor device. Therefore, it is essentially required system to understand the electrical characteristics of semiconductor device.Ecopia’s HMS series consist of constant current source , terminal conversion system by Van der Pauw technique, low temperature(77K) test system and magnetic flux density input system. So, it is well-established system that has all the things needed to Hall Effect Measurement System.
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PFX2500 Series -
Kikusui Electronics Corp.
PFX2500 Series is a high performance Charge/Discharge system controller that takes measurements in combination with our DC power supply and electronic load in order to evaluate test sample (electric storage elements such as secondary batteries) characteristics. It is also capable to perform evaluation test with high-performance, large capacity and wide range of rating with the combination of DC power supply and electronic load.Execution of the test is conducted by the exclusive application software. The test corresponds to long time continuous test and synchronization test with temperature chambers with the multiplexed protection performance. In addition, easy data editing is also capable with fulfilling graphic performance.
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MS 1111 -
Meltronics Systemtech
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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SG1000B/PR1000A -
Praxsym
The SG1000 Signal Generator and PR1000A Preamplifier have been designed to simplify the measurement of shielding integrity in a shielded enclosure. When coupled with a high stability spectrum analyzer and an appropriate selection of test antennas, the SG1000/PR1000A combination can measure shielding effectiveness at all of the NSA 94-106 (supersedes NSA 65-6) defined test frequencies from 1 kHz to 10 GHz.The PR1000A amplifies the received signal from the test antenna and overcomes the high noise figure of the companion test receiver or spectrum analyzer. The PR1000A will ensure that the system noise figure will be less than 4.5 dB at all test frequencies from 1 kHz to 10 GHz. When used with a spectrum analyzer measurement bandwidth of 100 Hz, the system exhibits a sensitivity of -150 dBm at the test antenna output.To overcome high cable loss between the test antenna and the PR1000A assembly at 10 GHz, a remote low noise pre-amplifier (Praxsym PN 310-010091-001) is mounted directly onto the 10 GHz antenna.
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Wuhan Sunma Technology Co., Ltd.
xDSL / PDH Analyzer mainly used for comprehensive transmission test of SDH/PDH network and equipment and widely applied in the R&D, manufacture, acceptance inspection, performance monitoring, maintenance and measuring of networks and equipment. The instrument SunmaFiber provided can insert and measure varieties of errors and alarms in PDH and SDH systems (including on-line and off-line test), perform performance analysis on various errors as well as modulate and test jitter signals at a max. test rate of 2488MHz (STM16).
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Applied Image, Inc.
APPLIED IMAGE is a world leader in the field of IMAGE EVALUATION Test Targets and Test Charts. Some of the specialized test charts include camera image evaluation ISO, NIST, ANSI, and MIL standard image evaluation applications; photonic and optophotonic applications; test charts for copiers and scanner; DATAcapture and BARcode Scanning testing; Security & Identification Image Capture; and all other type of imaging industries that require quality evaluation of thier image capture systems.
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6U VME 6021 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards.Designed primarily for applications in data acquisition, control and test instrumentation, it combines superior mechanical quality with lowest noise power supply technology.